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[IEEE Sixth International Symposium on Quality of Electronic Design (ISQED'05) - San Jose, CA, USA (21-23 March 2005)] Sixth International Symposium on Quality of Electronic Design (ISQED'05) - Modeling MOS Snapback for Circuit-Level ESD Simulation Using BSIM3 and VBIC Models
Yuanzhong Zhou,, Connerney, D., Carroll, R., Timwah Luk,Year:
2005
Language:
english
DOI:
10.1109/isqed.2005.81
File:
PDF, 187 KB
english, 2005