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[IEEE SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest - Cambridge, MA, USA (8-10 Sept. 1997)] SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest - Analysis of channel-width effects in 0.3 μm ultra-thin SOI NMOSFETs
Chang-Hoon Choi,, Sang-Hoon Lee,, Il-Kwon Kim,, Young-Kwan Park,, Jeong-Taek Kong,Year:
1997
Language:
english
DOI:
10.1109/sispad.1997.621330
File:
PDF, 474 KB
english, 1997