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[IEEE 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (8-12 July 2002)] Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614) - Dopant delineation: novel technique for silicon dopant implantation defects identification
Ng Sea Chooi,, Ng Jou Ching,Year:
2002
Language:
english
DOI:
10.1109/ipfa.2002.1025640
File:
PDF, 1.42 MB
english, 2002