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[IEEE 2012 19th IEEE International Conference and Workshops on Engineering of Computer Based Systems (ECBS) - Novi Sad, Serbia (2012.04.11-2012.04.13)] 2012 IEEE 19th International Conference and Workshops on Engineering of Computer-Based Systems - Yield Modeling for Error Tolerant and Partially Defect Tolerant Arrays
Ciric, Vladimir, Simic, Vladimir, Milentijevic, IvanYear:
2012
Language:
english
DOI:
10.1109/ecbs.2012.50
File:
PDF, 425 KB
english, 2012