Accurate channel length extraction by split C-V...

IEEE Electron Device Letters 2006 / 07 Vol. 27; Iss. 7

Accurate channel length extraction by split C-V measurements on short-channel MOSFETs

Severi, S., Curatola, G., Kerner, C., De Meyer, K.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
27
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2006.877711
Date:
July, 2006
File:
PDF, 125 KB
english, 2006
Conversion to is in progress
Conversion to is failed