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Accurate channel length extraction by split C-V measurements on short-channel MOSFETs
Severi, S., Curatola, G., Kerner, C., De Meyer, K.Volume:
27
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2006.877711
Date:
July, 2006
File:
PDF, 125 KB
english, 2006