![](/img/cover-not-exists.png)
A comprehensive analog single-event transient analysis methodology
Savage, M.W., Titus, J.L., Turflinger, T.L., Pease, R.L., Poivey, C.Volume:
51
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2004.839107
Date:
December, 2004
File:
PDF, 831 KB
english, 2004