[IEEE 2013 IEEE 31st VLSI Test Symposium (VTS) - Berkeley, CA (2013.4.29-2013.5.2)] 2013 IEEE 31st VLSI Test Symposium (VTS) - A hybrid ECC and redundancy technique for reducing refresh power of DRAMs
Yun-Chao Yu,, Chih-Sheng Hou,, Li-Jung Chang,, Jin-Fu Li,, Chih-Yen Lo,, Ding-Ming Kwai,, Yung-Fa Chou,, Cheng-Wen Wu,Year:
2013
Language:
english
DOI:
10.1109/vts.2013.6548927
File:
PDF, 181 KB
english, 2013