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[IEEE 2013 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2013.10.13-2013.10.17)] 2013 IEEE International Integrated Reliability Workshop Final Report - Dependence of the filament resistance on the duration of current overshoot
Shrestha, P., Nminibapiel, D., Campbell, J. P., Cheung, K. P., Baumgart, H., Deora, S., Bersuker, G.Year:
2013
Language:
english
DOI:
10.1109/iirw.2013.6804158
File:
PDF, 650 KB
english, 2013