[IEEE Thermal and Mechanical Simulation and Experiments in...

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[IEEE Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems - EuroSimE 2004 - Brussels, Belgium (10-12 May 2004)] 5th International Conference on Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems, 2004. EuroSimE 2004. Proceedings of the - Three-dimensional stress analysis of ink marking process [electronic packaging applications]

Chang-Lin Yeh,, Yi-Shao Lai,, Yi-Hsien Lin,, Jung-Shian Yang,
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Year:
2004
Language:
english
DOI:
10.1109/esime.2004.1304057
File:
PDF, 621 KB
english, 2004
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