Analysis of Bias Stress Instability in Amorphous InGaZnO...

IEEE Transactions on Device and Materials Reliability 2011 / 03 Vol. 11; Iss. 1

Analysis of Bias Stress Instability in Amorphous InGaZnO Thin-Film Transistors

Cho, Edward Namkyu, Kang, Jung Han, Kim, Chang Eun, Moon, Pyung, Yun, Ilgu
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Volume:
11
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2010.2096508
Date:
March, 2011
File:
PDF, 706 KB
english, 2011
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