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[IEEE 2012 IEEE 25th International SOC Conference (SOCC) - Niagara Falls, NY, USA (2012.09.12-2012.09.14)] 2012 IEEE International SOC Conference - Methodology to determine dominant noise source in a system-on-chip based implantable device
Gan, Zhihua, Salman, Emre, Stanacevic, MilutinYear:
2012
Language:
english
DOI:
10.1109/socc.2012.6398394
File:
PDF, 1.27 MB
english, 2012