Wafer level reliability and lifetime analysis of InGaAsP/InP quantum-well Fabry-Perot laser diode
Jae-Ho Han,, Sung-Woong Park,Volume:
5
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2005.860555
Date:
December, 2005
File:
PDF, 243 KB
english, 2005