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[IEEE 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2011.11.7-2011.11.10)] 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - On proving the efficiency of alternative RF tests

Kupp, Nathan, Stratigopoulos, Haralampos, Drineas, Petros, Makris, Yiorgos
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Year:
2011
Language:
english
DOI:
10.1109/iccad.2011.6105415
File:
PDF, 1.44 MB
english, 2011
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