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[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - Modeling of power supply noise using efficient macro-model of non-linear driver
Mutnury, B., Swaminathan, M., Libous, J.Year:
2004
Language:
english
DOI:
10.1109/isemc.2004.1349961
File:
PDF, 417 KB
english, 2004