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Reproducible strain measurement in electronic devices by applying integer multiple to scanning grating in scanning moiré fringe imaging
Kim, Suhyun, Jung, Younheum, Kim, Joong Jung, Lee, Sunyoung, Lee, Haebum, Kondo, YukihitoVolume:
4
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.4897379
Date:
October, 2014
File:
PDF, 2.40 MB
english, 2014