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[IEEE 2010 IEEE International Symposium on Electromagnetic Compatibility - EMC 2010 - Fort Lauderdale, FL (2010.07.25-2010.07.30)] 2010 IEEE International Symposium on Electromagnetic Compatibility - On chip filtering versus layout techniques to reduce RF coupled disturbances
Schro, P, Klotz, FYear:
2010
Language:
english
DOI:
10.1109/isemc.2010.5711275
File:
PDF, 718 KB
english, 2010