[IEEE 2010 23rd International Vacuum Nanoelectronics...

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[IEEE 2010 23rd International Vacuum Nanoelectronics Conference (IVNC) - Palo Alto, CA, USA (2010.07.26-2010.07.30)] International Vacuum Nanoelectronics Conference - P2–13: Field emission characteristics of carbon nanotube forest on etched Si substrate

Lee, Jungwoo, Park, Taehee, Lee, Jongtaek, Ahn, Juwon, Shin, Mingyeong, Yi, Whikun
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Year:
2010
Language:
english
DOI:
10.1109/ivnc.2010.5563155
File:
PDF, 1.12 MB
english, 2010
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