[IEEE 2013 International Conference on IC Design & Technology (ICICDT) - Pavia, Italy (2013.05.29-2013.05.31)] Proceedings of 2013 International Conference on IC Design & Technology (ICICDT) - Impact of the leadframe profile on the occurrence of passivation cracks of plastic-encapsulated electronic power devices
Ackaert, Jan, Mallik, Aditi, Vanderstraeten, DanielYear:
2013
Language:
english
DOI:
10.1109/icicdt.2013.6563311
File:
PDF, 522 KB
english, 2013