[IEEE International Electron Devices Meeting. IEDM...

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[IEEE International Electron Devices Meeting. IEDM Technical Digest - Washington, DC, USA (7-10 Dec. 1997)] International Electron Devices Meeting. IEDM Technical Digest - A PROM element based on salicide agglomeration of poly fuses in a CMOS logic process

Alavi, M., Bohr, M., Hicks, J., Denham, M., Cassens, A., Douglas, D., Tsai, M.-C.
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Year:
1997
Language:
english
DOI:
10.1109/iedm.1997.650515
File:
PDF, 596 KB
english, 1997
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