Point defects in Ni Si: 63Ni diffusion and differential 2...

Philosophical Magazine Letters 1997 / 07 Vol. 76; Iss. 1

Point defects in Ni Si: 63Ni diffusion and differential 2 scanning calorimetry study of quenched-in vacancies

Jennane, A., Sayouty, E.H., Bernardini, J., Moya, G.
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Volume:
76
Language:
english
Journal:
Philosophical Magazine Letters
DOI:
10.1080/095008397179354
Date:
July, 1997
File:
PDF, 148 KB
english, 1997
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