Surface and in depth chemistry of polycrystalline WO/sub 3/ thin films studied by X-ray and soft X-ray photoemission spectroscopies
Lozzi, L., Passacantando, M., Santucci, S., La Rosa, S., Svechnikov, N.Yu.Volume:
3
Language:
english
Journal:
IEEE Sensors Journal
DOI:
10.1109/jsen.2003.812629
Date:
April, 2003
File:
PDF, 406 KB
english, 2003