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[IEEE 2008 International Solid-State Circuits Conference - (ISSCC) - San Francisco, CA, USA (2008.02.3-2008.02.7)] 2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers - A CMOS Image Sensor Integrating Column-Parallel Cyclic ADCs with On-Chip Digital Error Correction Circuits
Kawahito, Shoji, Park, Jong-Ho, Isobe, Keigo, Shafie, Suhaidi, Iida, Tetsuya, Mizota, TakashiYear:
2008
Language:
english
DOI:
10.1109/isscc.2008.4523054
File:
PDF, 774 KB
english, 2008