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[IEEE 2010 IEEE Custom Integrated Circuits Conference -CICC 2010 - San Jose, CA, USA (2010.09.19-2010.09.22)] IEEE Custom Integrated Circuits Conference 2010 - Statistical modeling and post manufacturing configuration for scaled analog CMOS
Keskin, Gokce, Proesel, Jonathan, Pileggi, LarryYear:
2010
Language:
english
DOI:
10.1109/cicc.2010.5617625
File:
PDF, 405 KB
english, 2010