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[IEEE IEEE International Conference on Radar - Arlington, VA, USA (7-10 May 1990)] IEEE International Conference on Radar - Radar altimeter for surface analysis in planetary applications
Picardi, G., Seu, R., Melacci, P.T.Year:
1990
Language:
english
DOI:
10.1109/radar.1990.201132
File:
PDF, 531 KB
english, 1990