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[IEEE 2007 8th International Conference on Electronic Measurement and Instruments - Xian, China (2007.08.16-2007.07.18)] 2007 8th International Conference on Electronic Measurement and Instruments - Development of Intelligent Digital Circuit Test Module Based on VXI Bus
Zengjun, Bi, Wen, Sheng, Bin, Deng, Jiangping, YangYear:
2007
Language:
english
DOI:
10.1109/icemi.2007.4350597
File:
PDF, 496 KB
english, 2007