[IEEE IEEE Custom Integrated Circuits Conference 2006 - San...

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[IEEE IEEE Custom Integrated Circuits Conference 2006 - San Jose, CA, USA (2006.09.10-2006.09.13)] IEEE Custom Integrated Circuits Conference 2006 - Incremental Delta-Sigma Structures for DC Measurement: an Overview

Markus, Janos, Deval, Philippe, Quiquempoix, Vincent, Silva, Jose, Temes, Gabor
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Year:
2006
Language:
english
DOI:
10.1109/cicc.2006.320960
File:
PDF, 304 KB
english, 2006
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