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[IEEE IEEE Custom Integrated Circuits Conference 2006 - San Jose, CA, USA (2006.09.10-2006.09.13)] IEEE Custom Integrated Circuits Conference 2006 - Incremental Delta-Sigma Structures for DC Measurement: an Overview
Markus, Janos, Deval, Philippe, Quiquempoix, Vincent, Silva, Jose, Temes, GaborYear:
2006
Language:
english
DOI:
10.1109/cicc.2006.320960
File:
PDF, 304 KB
english, 2006