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[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Improving the Endurance Characteristics Through Boron Implant at Active Edge in 1 G NAND Flash
Kang, Daewoong, Chang, Sungnam, Seo, Seunggun, Song, Yongwook, Yoon, Hojin, Lee, Eunjung, Chang, Dongwon, Lee, Wonseong, Park, Byung-Gook, Lee, Jong Duk, Park, Il Han, Kang, Sangwoo, Shin, HyungcheolYear:
2007
Language:
english
DOI:
10.1109/relphy.2007.369996
File:
PDF, 789 KB
english, 2007