[IEEE Conference Proceedings. 1998 International Conference on Indium Phosphide and Related Materials - Tsukuba, Japan (11-15 May 1998)] Conference Proceedings. 1998 International Conference on Indium Phosphide and Related Materials (Cat. No.98CH36129) - Comparative investigation of gate leakage current in single and double channel InP HEMT
Ladner, C., Berthelemot-Aupetit, C., Decobert, J., Harmand, J.-C., Post, G., Vigier, P., Dumas, J.-M.Year:
1998
Language:
english
DOI:
10.1109/iciprm.1998.712571
File:
PDF, 279 KB
english, 1998