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Effective Scalable IEEE 1687 Instrumentation Network for Fault Management
Jutman, Artur, Devadze, Sergei, Shibin, KonstantinVolume:
30
Language:
english
Journal:
IEEE Design & Test
DOI:
10.1109/mdat.2013.2278535
Date:
October, 2013
File:
PDF, 783 KB
english, 2013