[IEEE Comput. Soc . Design, Automation and Test in Europe Conference and Exhibition - Paris, France (16-20 Feb. 2004)] Proceedings. Design, Automation and Test in Europe Conference and Exhibition - IP testing - the future differentiator?
Eklow, B.Year:
2004
Language:
english
DOI:
10.1109/date.2004.1269189
File:
PDF, 182 KB
english, 2004