[IEEE 2009 International Semiconductor Conference (CAS 2009) - Sinaia, Romania (2009.10.12-2009.10.14)] 2009 International Semiconductor Conference - Self test system for integrated hall effect sensors
Ionescu, Mihai-Alexandru, Bodner, Christof, Dineci, Stefan, Brezeanu, GheorgheYear:
2009
Language:
english
DOI:
10.1109/smicnd.2009.5336656
File:
PDF, 659 KB
english, 2009