[IEEE 2008 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Hong Kong, China (2008.12.8-2008.12.10)] 2008 IEEE International Conference on Electron Devices and Solid-State Circuits - Impact of stochastic mismatch on FinFETs SRAM cell induced by process variation
Yu, Shimeng, Zhao, Yuning, Du, Gang, Kang, Jinfeng, Han, Ruqi, Liu, XiaoyanYear:
2008
Language:
english
DOI:
10.1109/edssc.2008.4760701
File:
PDF, 884 KB
english, 2008