[IEEE 2008 IEEE International Conference on Electron...

  • Main
  • [IEEE 2008 IEEE International...

[IEEE 2008 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Hong Kong, China (2008.12.8-2008.12.10)] 2008 IEEE International Conference on Electron Devices and Solid-State Circuits - Impact of stochastic mismatch on FinFETs SRAM cell induced by process variation

Yu, Shimeng, Zhao, Yuning, Du, Gang, Kang, Jinfeng, Han, Ruqi, Liu, Xiaoyan
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2008
Language:
english
DOI:
10.1109/edssc.2008.4760701
File:
PDF, 884 KB
english, 2008
Conversion to is in progress
Conversion to is failed