[IEEE 2013 IEEE 19th International On-Line Testing...

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[IEEE 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Chania (2013.7.8-2013.7.10)] 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Timing vulnerability factors of sequential elements in modern microprocessors

Bramnik, Arkady, Sherban, Andrei, Seifert, Norbert
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Year:
2013
DOI:
10.1109/iolts.2013.6604051
File:
PDF, 356 KB
2013
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