[IEEE 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Chania (2013.7.8-2013.7.10)] 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Timing vulnerability factors of sequential elements in modern microprocessors
Bramnik, Arkady, Sherban, Andrei, Seifert, NorbertYear:
2013
DOI:
10.1109/iolts.2013.6604051
File:
PDF, 356 KB
2013