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[IEEE 2013 26th International Conference on VLSI Design: concurrently with the 12th International Conference on Embedded Systems - Pune, India (2013.01.5-2013.01.10)] 2013 26th International Conference on VLSI Design and 2013 12th International Conference on Embedded Systems - At-speed I/O Test for Fast Vref Optimization in High Speed Single-ended Memory Systems
Mukherjee, Sanku, Chandrasekaran, Srinivasaraman, E.K., Ganapathy Subramanyan, Sendhil, ArulYear:
2013
Language:
english
DOI:
10.1109/vlsid.2013.204
File:
PDF, 387 KB
english, 2013