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[IEEE 2013 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) - Natal, Brazil (2013.08.5-2013.08.7)] 2013 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) - Determining the test sources/sinks for NoC TAMs
Amory, Alexandre, Moreno, Edson, Moraes, Fernando, Lubaszewski, Marcelo S.Year:
2013
Language:
english
DOI:
10.1109/isvlsi.2013.6654615
File:
PDF, 1.04 MB
english, 2013