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[IEEE Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. - Grenoble, France (12-16 Sept. 2005)] Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. - Mixed-signal and noise properties of nmosfets with HfSiON/TaN gate stacks
Rittersma, Z.M., Simoen, E., Srinivasan, P., Vertregt, M., Claeys, C.Year:
2005
Language:
english
DOI:
10.1109/essder.2005.1546596
File:
PDF, 527 KB
english, 2005