[IEEE 2007 Joint 50th IEEE International Midwest Symposium on Circuits and Systems (MWSCAS) and the IEEE Northeast Workshop on Circuits and Systems (NEWCAS 2007) - Montreal, QC, Canada (2007.08.5-2007.08.8)] 2007 50th Midwest Symposium on Circuits and Systems - Experimental setup for the measurement of local temperature in electronic component during the steady and transient state

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