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[IEEE 2006 International Electron Devices Meeting - San Francisco, CA, USA (2006.12.11-2006.12.13)] 2006 International Electron Devices Meeting - High performance Hybrid and Monolithic Backside Thinned CMOS Imagers realized using a new integration process
De Munck, Koen, Tezcan, Deniz Sabuncuoglu, Borgers, Tom, Ruythooren, Wouter, De Moor, Piet, Sedky, Sherif, Toccafondi, Cinzia, Bogaerts, Jan, Van Hoof, ChrisYear:
2006
Language:
english
DOI:
10.1109/IEDM.2006.346979
File:
PDF, 1.04 MB
english, 2006