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[IEEE 2005 IEEE Instrumentationand Measurement Technology - Ottawa, ON, Canada (16-19 May 2005)] 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings - Generalized Analysis Model for Fringe Pattern Profilometry
Yingsong Hu,, Jiangtao Xi,, Zongkai Yang,, Enbang Li,, Chicharo, J.Volume:
3
Year:
2005
Language:
english
DOI:
10.1109/imtc.2005.1604512
File:
PDF, 141 KB
english, 2005