[IEEE Technical Digest of the 17th International Vacuum Nanoelectronics Conference - Cambridge, MA, USA (11-16 July 2004)] Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737) - Properties of single field emitters deduced by use of spherical Fowler-Nordheim theory
Creek, S.R., Edgcombe, C.J., de Jonge, N., Valdre, U.Year:
2004
Language:
english
DOI:
10.1109/ivnc.2004.1354887
File:
PDF, 153 KB
english, 2004