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[IEEE 2005 IEEE International Symposium on Circuits and Systems - Kobe, Japan (23-26 May 2005)] 2005 IEEE International Symposium on Circuits and Systems - A Novel Correlated Double Sampling Poly-Si Circuit for Readout Systems in Large Area X-Ray Sensors
Rankov, A., Rodriguez-Villegas, E., Lee, M.J.Year:
2005
Language:
english
DOI:
10.1109/iscas.2005.1464691
File:
PDF, 209 KB
english, 2005