Novel methods for circuit worst-case tolerance analysis

IEEE Transactions on Circuits and Systems I Fundamental Theory and Applications 1996 / 4 Vol. 43; Iss. 4

Novel methods for circuit worst-case tolerance analysis

Wei Tian,, Xie-Ting Ling,, Ruey-Wen Liu,
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Volume:
43
Language:
english
Journal:
IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications
DOI:
10.1109/81.488806
Date:
April, 1996
File:
PDF, 695 KB
english, 1996
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