[IEEE 2006 IEEE International Integrated Reliability Workshop Final Report - South Lake Tahoe, CA, USA (2006.10.16-2006.09.19)] 2006 IEEE International Integrated Reliability Workshop Final Report - Temperature Effects on the Hot-Carrier Induced Degradation of pMOSFETs
Chen, Shuang-yuan, Tu, Chia-hao, Lin, Jung-chun, Kao, Po-wei, Lin, Wen-cheng, Jhou, Ze-wei, Chou, Sam, Ko, Joe, Haung, Heng-shengYear:
2006
Language:
english
DOI:
10.1109/irws.2006.305236
File:
PDF, 3.81 MB
english, 2006