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[IEEE 2010 International Conference on Progress in Informatics and Computing (PIC) - Shanghai, China (2010.12.10-2010.12.12)] 2010 IEEE International Conference on Progress in Informatics and Computing - Rebar automatically counting on the product line
Su, Zhiqi, Fang, Kangling, Peng, Zhengtao, Feng, ZhifanYear:
2010
Language:
english
DOI:
10.1109/pic.2010.5688012
File:
PDF, 830 KB
english, 2010