Design of test stimuli and minimisation of ambiguity in...

International Journal of Electronics 2011 / 02 Vol. 98; Iss. 2

Design of test stimuli and minimisation of ambiguity in fault diagnosis of analogue circuits with tolerance

Tan, Yanghong, He, Yigang, Sun, Yichuang
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Volume:
98
Language:
english
Journal:
International Journal of Electronics
DOI:
10.1080/00207217.2010.506839
Date:
February, 2011
File:
PDF, 580 KB
english, 2011
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