![](/img/cover-not-exists.png)
[IEEE 2010 IEEE 10th Conference on Nanotechnology (IEEE-NANO) - Ilsan, Gyeonggi-Do, Korea (South) (2010.08.17-2010.08.20)] 10th IEEE International Conference on Nanotechnology - Fabrication of long tip AFM probes for highly coarse samples
Kang, Hyen-Wook, Kawashima, Yoshiteru, Muramatsu, HiroshiYear:
2010
DOI:
10.1109/nano.2010.5697902
File:
PDF, 286 KB
2010