[IEEE 2014 27th International Vacuum Nanoelectronics Conference (IVNC) - Engelberg, Switzerland (2014.7.6-2014.7.10)] 2014 27th International Vacuum Nanoelectronics Conference (IVNC) - Work function measurement of Ce-oxide/W(100) surface by using of photoemission electron microscope
Nakane, Hideaki, Kawakubo, TakashiYear:
2014
Language:
english
DOI:
10.1109/ivnc.2014.6894760
File:
PDF, 389 KB
english, 2014