Simultaneous Measurement of Minority-Carrier Lifetime in...

IEEE Journal of Photovoltaics 2014 / 9 Vol. 4; Iss. 5

Simultaneous Measurement of Minority-Carrier Lifetime in Single-Crystal CdTe Using Three Transient Decay Techniques

Johnston, Steve, Zaunbrecher, Katherine, Ahrenkiel, Richard, Kuciauskas, Darius, Albin, David, Metzger, Wyatt
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Volume:
4
Language:
english
Journal:
IEEE Journal of Photovoltaics
DOI:
10.1109/jphotov.2014.2339491
Date:
September, 2014
File:
PDF, 810 KB
english, 2014
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