[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - Tackling the Path Explosion Problem in Symbolic Execution-Driven Test Generation for Programs
Krishnamoorthy, Saparya, Hsiao, Michael S., Lingappan, LoganathanYear:
2010
Language:
english
DOI:
10.1109/ats.2010.19
File:
PDF, 297 KB
english, 2010