[IEEE 2010 IEEE/MTT-S International Microwave Symposium -...

  • Main
  • [IEEE 2010 IEEE/MTT-S International...

[IEEE 2010 IEEE/MTT-S International Microwave Symposium - MTT 2010 - Anaheim, CA, USA (2010.05.23-2010.05.28)] 2010 IEEE MTT-S International Microwave Symposium - Parameter analysis and reader architectures for broadband 13.56 MHz RFID systems

Gossar, M., Witschnig, H., Enzinger, H.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2010
Language:
english
DOI:
10.1109/mwsym.2010.5515228
File:
PDF, 104 KB
english, 2010
Conversion to is in progress
Conversion to is failed